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Measurement and Inspection Equipment - List of Manufacturers, Suppliers, Companies and Products

Measurement and Inspection Equipment Product List

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Optical measurement and inspection device "Optical Beam NFP Measurement Device"

We can accommodate a wide range of services from observing and measuring light beam profiles to analyzing optical properties!

The "Light Beam NFP Measurement Device" is a versatile optical beam profiler system capable of a wide range of applications, from observing and measuring the light beam profile of light-emitting elements, optical fibers, optical waveguides, and various optical modules to analyzing optical characteristics. The optical system uses our high-performance NFP measurement optical system (a simplified NFP measurement optical system is also available), and in combination with various optical detectors and the light beam analysis module AP013, it can be used for NFP measurement, light beam shape observation, and light beam profile measurement and analysis of various optical devices. Additionally, by selecting different optical detectors, it is possible to construct various systems ranging from the visible spectrum to the 1550 nm near-infrared wavelength band used in optical communications. 【Features】 ■ Uses the high-performance NFP measurement optical system M-Scope type S ■ Capable of measurements from the visible spectrum to the near-infrared range by selecting optical detectors ■ Enables measurement and analysis of various optical devices in combination with the light beam analysis module AP013 ■ System construction is possible at a low cost *For more details, please feel free to contact us.

  • Other inspection equipment and devices
  • Optical Measuring Instruments

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Optical Measurement and Inspection Device "Wafer-Level Optical Device Characterization System"

A system for analyzing electrical and optical characteristic measurements at the wafer level.

The "Wafer-Level Optical Device Characterization System" is a system that analyzes the electrical and optical characteristics of light-emitting devices such as VCSELs and LEDs, as well as light-receiving devices like photodiodes and illuminance sensors, at the wafer level. This product combines a prober system for semiconductor failure analysis, such as a semi-auto prober or manual prober, with our various optical measurement systems from the M-Scope series, measurement light sources, and measuring instruments to analyze and collect data on the electrical and optical characteristics of optical semiconductor devices at the wafer level. Additionally, by combining with a semi-auto prober, it is also possible to support automatic measurement of wafers. 【Features】 ■ Capable of measuring various electrical and optical characteristics of light-emitting and light-receiving devices at the wafer level ■ Achieves automation, speed-up, and labor-saving for various measurements ■ Can be equipped with various optical systems from our M-Scope series for optical measurement ■ Includes the Optometrics Customized Version optical measurement and analysis software ■ Capable of wide-ranging applications from individual device measurements to inline use *For more details, please feel free to contact us.

  • Microscope
  • Other measurement, recording and measuring instruments
  • Optical Measuring Instruments

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Case Studies of Inspection and Measurement Systems (Realizing Quantification of Sensory Evaluation)

Achieving quality improvement through the quantification of inspection contents and items! Utilizing JUKI's inspection algorithms and AI, continuous and accurate inspections are possible.

We would like to introduce a case study of JUKI's automation implementation. The inspection machine "SE1000" automates various inspection processes that were previously performed manually, including dimensional measurement, flatness inspection, scratches, and dents. Variability in inspection results due to inspectors or time of day can be reduced by using our inspection machine. 【Effects】 ■ Improvement in quality through quantification of inspection content and items ■ Continuous and accurate inspections made possible by utilizing JUKI's inspection algorithms and AI ■ Reduction of inspection errors, omissions, and inconsistencies due to individual differences and time of day *For more details, please refer to the PDF document or feel free to contact us.

  • Visual Inspection Equipment

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